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[IEEE 2014 International Symposium on Next-Generation Electronics (ISNE) - Kwei-Shan Tao-Yuan, Taiwan (2014.5.7-2014.5.10)] 2014 International Symposium on Next-Generation Electronics (ISNE) - Electrical quality of 28nm HK/MG MOSFETs with PDA and DPN treatment
Lee, Win-Der, Lian, Chun-Wei, Wang, Shea-Jue, Yu, Yi-Hong, Cheng, Osbert, Huang, L S, Wang, Mu-ChunYear:
2014
Language:
english
DOI:
10.1109/ISNE.2014.6839328
File:
PDF, 1.10 MB
english, 2014