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Analytical Device Model of SOI MOSFETs Including Self-Heating Effect
Yasuda, Naoki, Ueno, Shuichi, Taniguchi, Kenji, Hamaguchi, Chihiro, Yamaguchi, Yasuo, Nishimura, TadashiVolume:
30
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.30.3677
Date:
December, 1991
File:
PDF, 1.22 MB
1991