Fourier Analysis of Interference Structure in X-Ray...

Japanese Journal of Applied Physics 1992 / 2 Vol. 31; Iss. Part 2, No

Fourier Analysis of Interference Structure in X-Ray Specular Reflection from Thin Films

Sakurai, Kenji, Iida, Atsuo
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Volume:
31
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.31.L113
Date:
February, 1992
File:
PDF, 473 KB
1992
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