[IEEE 2014 27th International Conference on VLSI Design - India (2014.01.5-2014.01.9)] 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems - A New Sensitivity-Driven Process Variation Aware Self-Repairing Low-Power SRAM Design
Yadav, Nandakishor, Dutt, Sunil, Sharma, G.K.Year:
2014
Language:
english
DOI:
10.1109/VLSID.2014.27
File:
PDF, 1.12 MB
english, 2014