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[IEEE 2010 IEEE Applied Imagery Pattern Recognition Workshop (AIPR 2010) - Washington, DC, USA (2010.10.13-2010.10.15)] 2010 IEEE 39th Applied Imagery Pattern Recognition Workshop (AIPR) - A system and method for auto-correction of first order lens distortion
Fry, Jonathan, Pusateri, MichaelYear:
2010
Language:
english
DOI:
10.1109/AIPR.2010.5759696
File:
PDF, 1.13 MB
english, 2010