studied by x-ray resonant magnetic scattering
Kim, M. G., Soh, J., Lang, J., Dean, M. P. M., Thaler, A., Bud'ko, S. L., Canfield, P. C., Bourret-Courchesne, E., Kreyssig, A., Goldman, A. I., Birgeneau, R. J.Volume:
88
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.88.014424
Date:
July, 2013
File:
PDF, 378 KB
english, 2013