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RAPD Fragment Profiles from Deteriorating Soybean Seeds
J. Marcos-Filho, M. B. McDonald, D. M. TeKrony and J. ZhangVolume:
19
Year:
1997
Language:
english
Journal:
Seed Technology
DOI:
10.2307/23433248
File:
PDF, 1.47 MB
english, 1997