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Examination of the Cuticular Surfaces of Fresh Delicate Leaves and Petals with a Scanning Electron Microscope: A Control for Artefacts
D. W. EvelingVolume:
96
Language:
english
Journal:
New Phytologist
DOI:
10.2307/2432399
Date:
February, 1984
File:
PDF, 1.90 MB
english, 1984