Interfacial Strain-Induced Oxygen Disorder as the Cause of...

Advanced Functional Materials 2009 Vol. 19; Iss. 6

Interfacial Strain-Induced Oxygen Disorder as the Cause of Enhanced Critical Current Density in Superconducting Thin Films

Stuart C. Wimbush, Meicheng Li, Mary E. Vickers, Boris Maiorov, D. Matt Feldmann, Quanxi Jia, Judith L. MacManus-Driscoll
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Volume:
19
Year:
2009
Language:
english
Pages:
7
DOI:
10.1002/adfm.200801112
File:
PDF, 583 KB
english, 2009
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