High-Density Carrier Accumulation in ZnO Field-Effect Transistors Gated by Electric Double Layers of Ionic Liquids
Hongtao Yuan, Hidekazu Shimotani, Atsushi Tsukazaki, Akira Ohtomo, Masashi Kawasaki, Yoshihiro IwasaVolume:
19
Year:
2009
Language:
english
Pages:
8
DOI:
10.1002/adfm.200801633
File:
PDF, 650 KB
english, 2009