Nonparametric Detection of Correlated Errors

Biometrika 2004 / 06 Vol. 91; Iss. 2

Nonparametric Detection of Correlated Errors

Tae Yoon Kim, Donghoh Kim, Byeong U. Park and Douglas G. Simpson
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Volume:
91
Language:
english
Journal:
Biometrika
DOI:
10.2307/20441115
Date:
June, 2004
File:
PDF, 576 KB
english, 2004
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