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Detailed Characterization of Contact Resistance, Gate-Bias-Dependent Field-Effect Mobility, and Short-Channel Effects with Microscale Elastomeric Single-Crystal Field-Effect Transistors
Colin Reese, Zhenan BaoVolume:
19
Year:
2009
Pages:
1
DOI:
10.1002/adfm.200990031
File:
PDF, 28 KB
2009