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Sampling Inspection Plans for Discriminating between Two Weibull Processes
A. S. Qureishi, K. J. Nabavian and J. D. AlanenVolume:
7
Language:
english
Journal:
Technometrics
DOI:
10.2307/1266398
Date:
November, 1965
File:
PDF, 1.02 MB
english, 1965