![](/img/cover-not-exists.png)
A Bayesian Scheme to Detect Changes in the Mean of a Short-Run Process
Panagiotis Tsiamyrtzis and Douglas M. HawkinsVolume:
47
Language:
english
Journal:
Technometrics
DOI:
10.2307/25471069
Date:
November, 2005
File:
PDF, 2.08 MB
english, 2005