A Bayesian Scheme to Detect Changes in the Mean of a...

A Bayesian Scheme to Detect Changes in the Mean of a Short-Run Process

Panagiotis Tsiamyrtzis and Douglas M. Hawkins
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Volume:
47
Language:
english
Journal:
Technometrics
DOI:
10.2307/25471069
Date:
November, 2005
File:
PDF, 2.08 MB
english, 2005
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