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Influence of interface states on field effect and capacitance-voltage characteristics of metal/oxide/a-Si:H structures
Tohru Suzuki, Masataka Hirose, Masato Ueda, Yukio OsakaVolume:
8
Year:
1982
Language:
english
Pages:
8
DOI:
10.1016/0165-1633(82)90071-5
File:
PDF, 326 KB
english, 1982