X-ray diffraction study of texture and growth of RF-sputtered CdS films
A. Bennouna, E.L. Ameziane, A. Haouni, N. Ghermani, M. Azizan, M. BrunelVolume:
20
Year:
1990
Language:
english
Pages:
11
DOI:
10.1016/0165-1633(90)90032-v
File:
PDF, 503 KB
english, 1990