Plasmid DNA Breakage by Decay of DNA-Associated Auger...

Plasmid DNA Breakage by Decay of DNA-Associated Auger Electron Emitters: Approaches to Analysis of Experimental Data

Pavel N. Lobachevsky, Tom C. Karagiannis and Roger F. Martin
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Volume:
162
Language:
english
Journal:
Radiation Research
DOI:
10.2307/3581073
Date:
July, 2004
File:
PDF, 1.70 MB
english, 2004
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