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Microprocessor based TCR measurement and grading of resistors
A. Mathialagan, V. Venkatachalam, R. Krishnamoorthy, V. Lakshmi NarasimhanVolume:
6
Year:
1985
Language:
english
Pages:
5
DOI:
10.1016/0166-3615(85)90077-6
File:
PDF, 291 KB
english, 1985