Experimental measurement of the frequency dependent memory function for the 2D electron gas in Si inversion layers
S.J. Allen, B.A. Wilson, D.C. Tsui, A. Gold, W. GötzeVolume:
113
Year:
1982
Language:
english
Pages:
1
DOI:
10.1016/0167-2584(82)90464-9
File:
PDF, 40 KB
english, 1982