![](/img/cover-not-exists.png)
Energy loss of warm electrons at the interface of (100) silicon MOSFETs
W. Hönlein, G. LandwehrVolume:
113
Year:
1982
Language:
english
Pages:
1
DOI:
10.1016/0167-2584(82)90473-x
File:
PDF, 84 KB
english, 1982