Nickel 3d electron distribution of small particles embedded in SiO and of bulk nickel-SiO interface
D. Fargues, F. Vergand, C. BonnelleVolume:
156
Year:
1985
Language:
english
Pages:
1
DOI:
10.1016/0167-2584(85)90447-5
File:
PDF, 44 KB
english, 1985