An analysis of angular dependent XPS peak intensities

Surface Science Letters 1985 Vol. 154; Iss. 2-3

An analysis of angular dependent XPS peak intensities

R.A. Armstrong, W.F. Egelhoff Jr.
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Volume:
154
Year:
1985
Language:
english
Pages:
1
DOI:
10.1016/0167-2584(85)91142-9
File:
PDF, 331 KB
english, 1985
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