Tunneling microscopy and spectroscopy of semiconductor...

Surface Science Letters 1986 Vol. 168; Iss. 1-3

Tunneling microscopy and spectroscopy of semiconductor surfaces and interfaces

A. Baratoff, G. Binnig, H. Fuchs, F. Salvan, E. Stoll
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Volume:
168
Year:
1986
Language:
english
Pages:
1
DOI:
10.1016/0167-2584(86)90495-0
File:
PDF, 45 KB
english, 1986
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