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Reduction of SiC surface oxides by a Ga molecular beam: LEED and electron spectroscopy studies
R. Kaplan, T.M. ParrillVolume:
165
Year:
1986
Language:
english
Pages:
1
DOI:
10.1016/0167-2584(86)91172-2
File:
PDF, 378 KB
english, 1986