A new method for ellipsometric inversion with...

A new method for ellipsometric inversion with microcomputers: Characterization of optically absorbing films using multiple-angle-of-incidence

T. Easwarakhanthan, P. Mas, M. Renard, S. Ravelet
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
216
Year:
1989
Language:
english
Pages:
1
DOI:
10.1016/0167-2584(89)90874-8
File:
PDF, 87 KB
english, 1989
Conversion to is in progress
Conversion to is failed