Nickel deposition on TiO2(100): Characterization by AES and SIMS
Sylvie Bourgeois, Dramane Diakité, François Jomard, Marcel Perdereau, Richard PoiraultVolume:
217
Year:
1989
Language:
english
Pages:
1
DOI:
10.1016/0167-2584(89)90969-9
File:
PDF, 52 KB
english, 1989