Critical issues in the application of a gallium probe to...

Surface Science Letters 1990 Vol. 246; Iss. 1-3

Critical issues in the application of a gallium probe to high resolution secondary ion imaging

R. Levi-Setti, P. Hallégot, C. Girod, J.M. Chabala, J. Li, A. Sodonis, W. Wolbach
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Volume:
246
Year:
1990
Language:
english
Pages:
1
DOI:
10.1016/0167-2584(90)90017-2
File:
PDF, 70 KB
english, 1990
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