A combined AP-FIM/HREM approach to the characterization of microstructure in a Mn-added TiAl intermetallic compound
M. Saga, R. Uemori, M. Tanino, H. MorikawaVolume:
246
Year:
1990
Language:
english
Pages:
1
DOI:
10.1016/0167-2584(90)90038-9
File:
PDF, 65 KB
english, 1990