Lateral resolution of Auger electron spectroscopy in the energy range 5–100 keV: Thin overlayers on a high-Z material substrate
N.M. Glezos, A.G. NassiopoulosVolume:
254
Year:
1991
Language:
english
Pages:
1
DOI:
10.1016/0167-2584(91)90048-v
File:
PDF, 62 KB
english, 1991