The structure of thin NiO(100) films grown on Ni(100) as determined by low-energy-electron diffraction and scanning tunneling microscopy
M. Bäumer, D. Cappus, H. Kuhlenbeck, H.-J. Freund, G. Wilhelmi, A. Brodde, H. NeddermeyerVolume:
253
Year:
1991
Language:
english
Pages:
1
DOI:
10.1016/0167-2584(91)90380-a
File:
PDF, 153 KB
english, 1991