A study of the Si(111)√3 × √3-Ag surface by transmission X-ray diffraction and X-ray diffraction topography
Toshio Takahashi, Shinichiro Nakatani, Naoko Okamoto, Tetsuya Ishikawa, Seishi KikutaVolume:
242
Year:
1991
Language:
english
Pages:
1
DOI:
10.1016/0167-2584(91)90422-n
File:
PDF, 72 KB
english, 1991