X-ray standing wave analysis of the GaAs/Si interface
Tomoaki Kawamura, Yukio Fukuda, Masaharu Oshima, Yoshiro Ohmachi, Izumi Koichi, Hirano Keiichi, Tetsuya Ishikawa, Seishi KikutaVolume:
251-252
Year:
1991
Language:
english
Pages:
1
DOI:
10.1016/0167-2584(91)90851-h
File:
PDF, 133 KB
english, 1991