Surface diffusion during thin film annealing studied by XPS
Arjen Bot, Udo van Slooten, Wim R. Koppers, Aart W. KleynVolume:
287-288
Year:
1993
Language:
english
Pages:
1
DOI:
10.1016/0167-2584(93)90560-6
File:
PDF, 69 KB
english, 1993