Study of GeSi solid solution crystals by X-ray topography...

Nuclear Instruments and Methods in Physics Research 1983 Vol. 213; Iss. 2-3

Study of GeSi solid solution crystals by X-ray topography and neutron diffraction

M.L. Kozhukh, I.N. Belokurova, S.B. Vakhrushev, A.N. Titkov, I.L. Shul'pina
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Volume:
213
Year:
1983
Language:
english
Pages:
5
DOI:
10.1016/0167-5087(83)90445-3
File:
PDF, 273 KB
english, 1983
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