Synchrotron X-ray diffraction applied to the study of...

Synchrotron X-ray diffraction applied to the study of physisorbed monolayers

M. Nielsen, J. Bohr, K. Kjær, J. Als-Nielsen, J.P. McTague
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Volume:
208
Year:
1983
Language:
english
Pages:
6
DOI:
10.1016/0167-5087(83)91180-8
File:
PDF, 426 KB
english, 1983
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