A high temperature tensile stage for X-ray synchrotron topographic studies of dislocation mechanisms in semiconductors
Amand George, Jean-Pierre Michel, Gérard MichotVolume:
208
Year:
1983
Language:
english
Pages:
4
DOI:
10.1016/0167-5087(83)91214-0
File:
PDF, 435 KB
english, 1983