On a Multiple-Scales Analysis of Multilateral Phenomena in...

On a Multiple-Scales Analysis of Multilateral Phenomena in Semiconductor Lasers

Benjamin P. Cox and Warren R. Smith
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Volume:
69
Year:
2008
Language:
english
Journal:
SIAM Journal on Applied Mathematics
DOI:
10.2307/40233771
File:
PDF, 1.40 MB
english, 2008
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