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Exploiting Symmetry in Fan Beam CT: Overcoming Third Generation Undersampling
Steven H. Izen, David P. Rohler and Sastry K. L. A.Volume:
65
Language:
english
Journal:
SIAM Journal on Applied Mathematics
DOI:
10.2307/4096206
Date:
February, 2005
File:
PDF, 1.17 MB
english, 2005