Soft X-ray microscopy at the NSLS
J.M. Kenney, J. Kirz, H. Rarback, M.R. Howells, P. Chang, P.J. Coane, R. Feder, P.J. Houzego, D.P. Kern, D. SayreVolume:
222
Year:
1984
Language:
english
Pages:
5
DOI:
10.1016/0167-5087(84)90500-3
File:
PDF, 1.17 MB
english, 1984