Sensitivity Analysis for Nonrandom Dropout: A Local...

Biometrics 2001 / 03 Vol. 57; Iss. 1

Sensitivity Analysis for Nonrandom Dropout: A Local Influence Approach

Geert Verbeke, Geert Molenberghs, Herbert Thijs, Emmanuel Lesaffre and Michael G. Kenward
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Volume:
57
Language:
english
Journal:
Biometrics
DOI:
10.2307/2676836
Date:
March, 2001
File:
PDF, 1.38 MB
english, 2001
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