Three-Dimensional Carrier Profiling of Individual Si...

Advanced Materials 2010 Vol. 22; Iss. 36

Three-Dimensional Carrier Profiling of Individual Si Nanowires by Scanning Spreading Resistance Microscopy

Xin Ou, Pratyush Das Kanungo, Reinhard Kögler, Peter Werner, Ulrich Gösele, Wolfgang Skorupa, Xi Wang
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Volume:
22
Year:
2010
Language:
english
Pages:
5
DOI:
10.1002/adma.201001086
File:
PDF, 491 KB
english, 2010
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