Surface Wrinkling: A Versatile Platform for Measuring...

Surface Wrinkling: A Versatile Platform for Measuring Thin-Film Properties

Jun Young Chung, Adam J. Nolte, Christopher M. Stafford
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Volume:
23
Year:
2011
Language:
english
Pages:
20
DOI:
10.1002/adma.201001759
File:
PDF, 1.59 MB
english, 2011
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