![](/img/cover-not-exists.png)
Electric-Field-Induced Resistive Switching in a Family of Mott Insulators: Towards a New Class of RRAM Memories
Laurent Cario, Cristian Vaju, Benoit Corraze, Vincent Guiot, Etienne JanodVolume:
22
Year:
2010
Language:
english
Pages:
5
DOI:
10.1002/adma.201002521
File:
PDF, 2.28 MB
english, 2010