Spectroscopic Characterization of Charged Defects in...

Advanced Materials 2011 Vol. 23; Iss. 5

Spectroscopic Characterization of Charged Defects in Polycrystalline Pentacene by Time- and Wavelength-Resolved Electric Force Microscopy

Justin L. Luria, Kathleen A. Schwarz, Michael J. Jaquith, Richard G. Hennig, John A. Marohn
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Volume:
23
Year:
2011
Language:
english
Pages:
5
DOI:
10.1002/adma.201003073
File:
PDF, 444 KB
english, 2011
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