Conductive Atomic Force Microscope Nanopatterning of...

Conductive Atomic Force Microscope Nanopatterning of Epitaxial Graphene on SiC(0001) in Ambient Conditions

Justice M. P. Alaboson, Qing Hua Wang, Joshua A. Kellar, Joohee Park, Jeffrey W. Elam, Michael J. Pellin, Mark C. Hersam
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Volume:
23
Year:
2011
Language:
english
Pages:
4
DOI:
10.1002/adma.201100367
File:
PDF, 394 KB
english, 2011
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