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The capacitive coupling error and the capacitive coupling cross talk in electron beam testing of passivated IC and measures for their reduction
Wolfgang Mertin, Klaus Dieter Herrmann, Erich Kubalek, Rainer Lackmann, Gerd Weichert, Günther ZimmerVolume:
12
Year:
1990
Language:
english
Pages:
9
DOI:
10.1016/0167-9317(90)90048-x
File:
PDF, 538 KB
english, 1990