Characterization of submicron NMOS devices due to visible light emission
I. Schönstein, J. Müller, U. Hilleringmann, K. GoserVolume:
21
Year:
1993
Language:
english
Pages:
4
DOI:
10.1016/0167-9317(93)90092-j
File:
PDF, 290 KB
english, 1993