Identification of defects in SiO2 thermally grown on...

Identification of defects in SiO2 thermally grown on Czochralski Si

Manabu Itsumi, Masato Tomita, Masataka Yamawaki
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Volume:
28
Year:
1995
Language:
english
Pages:
4
DOI:
10.1016/0167-9317(95)00011-v
File:
PDF, 254 KB
english, 1995
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