Radiation induced electron and hole traps in thermal SiO2
V.V. Afanas'ev, J.M.M. de Nijs, A. Stesmans, P. BalkVolume:
28
Year:
1995
Language:
english
Pages:
4
DOI:
10.1016/0167-9317(95)00012-w
File:
PDF, 375 KB
english, 1995