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Improved hot-carrier immunity of p-MOSFET's with 8nm thick nitrided gate-oxide during bi-directional stressing
A. Bravaix, D. Vuillaume, D. Goguenheim, D. Dorval, M. HaondVolume:
28
Year:
1995
Language:
english
Pages:
4
DOI:
10.1016/0167-9317(95)00058-g
File:
PDF, 328 KB
english, 1995